KNT-Scientific-Publications

New Methods for Calibrated Scanning Thermal Microscopy (SThM)

A batch microfabricated scanning thermal microscopy (SThM) probe is presented. The sensor, based on a Pd resistance thermometer is shown to be suitable for calibration and stable for very long periods (> 700 hours). A technique for achieving transformer isolation of the SThM probe is described and shown to be a highly effective route to obtaining calibrated SThM scans of electrically sensitive samples as well as those subject to large bias voltages.

Dobson, P. S., Weaver, J. M., & Mills, G. (2007, October). New methods for calibrated scanning thermal microscopy (SThM). In Sensors, 2007 IEEE (pp. 708-711). IEEE.
https://doi.org/10.1109/ICSENS.2007.4388498

Share this post

Share on facebook
Share on twitter
Share on linkedin
Share on google
Share on pinterest
Share on print
Share on email
OFC-2019
News & Events

OFC Conference 2019

The Optical Networking and Communication Conference & Exhibition is the largest global conference and exhibition for optical communications, held in the San

Read More »

How can we help you to bring your project together?