KNT-Scientific-Publications

New Methods for Calibrated Scanning Thermal Microscopy (SThM)

A batch microfabricated scanning thermal microscopy (SThM) probe is presented. The sensor, based on a Pd resistance thermometer is shown to be suitable for calibration and stable for very long periods (> 700 hours). A technique for achieving transformer isolation of the SThM probe is described and shown to be a highly effective route to obtaining calibrated SThM scans of electrically sensitive samples as well as those subject to large bias voltages.

Dobson, P. S., Weaver, J. M., & Mills, G. (2007, October). New methods for calibrated scanning thermal microscopy (SThM). In Sensors, 2007 IEEE (pp. 708-711). IEEE.
https://doi.org/10.1109/ICSENS.2007.4388498

Share this post

Share on facebook
Share on twitter
Share on linkedin
Share on google
Share on pinterest
Share on print
Share on email

How can we help you to bring your project together?